Research

• Scientific clusters
  • MIcrostructure, Mécanique, EXpérimentation
    • MIMEX staff
    • Ongoing projects
    • Expertises and equipments
  • SImulation des Matériaux et des Structures
    • SIMS staff
    • Ongoing projects
    • Expertises and equipments
  • Surfaces, Interfaces, Procédés
    • SIP staff
    • Ongoing projects
    • Expertises and equipments
  • Transverse axis : FAMHES
    • FAMHES staff
    • Ongoing projects
    • Expertises and equipments
• Technical Divisions
  • µMAX
  • AT-JPE
  • STAR
• Partnership
• Publications
• Technology transfer
  • ZÉBULON code
• Thesis in progress
• Thesis defended

µMAX : Technical resources

Technical resources for Metallography, Optical Microscopy & Scanning and Transmission Electron Microscopies

Cutting

• W3242 Escil wire saw for precision cutting on a wide variety of materials without disturbing the sample
• Isomet 5000 Buehler Chainsaw for cutting small samples or serial cuts
• Discotom 5 Struers Chainsaw for cutting large samples

Coating

• Possibility to coat cold, hot and vacuum

Polishing

• 5 two-speed polishing drums or variable speed for SiC abrasive paper
• 3 two-speed polishing drums for diamond polishing or colloidal silica
• 2 polishing machines for automatic polishing 230 and 300
• 1 vibratory cleaner
• 1 electrolytic polishing machine
• Highlighting the structure
• Chemical and electrolytic attack

Light microscopy

• Park of upright or inverted microscopes
• Wild binocular, zoom and additional lenses, equipped with a 12 MPix Jenoptik Progress CF Scan digital camera
• Zeiss Axiovert 405M inverted microscope for working in brightfield, blackfield, polarized light and interference contrast, equipped with a digital camera Jenoptik Progress CF Scan 12 MPix

Hardness test

• 2 machines of hardness Dia Testor 2 : 1 to 250 kg
• Buehler Micromet 5114 semi-automatic microdurometer : 0.5g to 5g - 10g to 2kg

Scanning Electron Microscopy (SEM)

• SEM LEO 1450VP equipped with an X EDS Thermo System Six microanalysis system and a 10 kN traction plate
• SEM S-FEG Zeiss Gemini DSM982 equipped with a Noran Voyager IV EDS X-ray microanalysis system and a Nordif UF300 EBSD camera
• SEM S-FEG FEI Nova NanoSEM 450 equipped with EDS Bruker Quantax SDS X-ray microanalysis system and Hikari EDAX-TSL EBSD camera

Castaing microprobe (EPMA)

• Castaing CAMECA SX100 microprobe with 4 WDS spectrometers and 1 EDS system

Preparation material for microscopy

• Edwards E306 Secondary Vacuum Evaporator
• Polaron SC-7640 Primary Vacuum Cathode Sprayer
• Cressington 208 HR Primary Vacuum Cathode Spray Gun for High Resolution
• Emscope TB 500 Carbon Evaporator
• Gatan PECS Precision Metallization & Ion Scanning System

Photography

• Canon EOS Digital SLR Camera